Vol.36 No.4(2001.12)
Research Report

A New Processing Technique to Prevent Stiction Using Silicon Selective Etching for SOI-MEMS
Norio Fujitsuka, Jiro Sakata

A new processing technique to realize an extremely long cantilever structure having a length of a few mm using a silicon-on-insulator(SOI) wafer has been developed. By adding only one Si selective wet etching process after the usual HF sacrificial layer etching, the detachment length of a cantilever became at least 10 times longer than that formed using conventional method. This technique is easily applicable to the fabrication of various SOI-MEMS without the use of any special apparatus.



 



HOME  / JAPANESE / ENGLISH Copyright (c)1997-2012 Toyota Central R&D Labs.,Inc. All rights Reserved.