Contents
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Foreword
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Expectations for Practical Studies
on Surface and Interface
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Akira Hosono
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Special
Issue :Surface and Interface Control
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Review
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Surface and Interface Control in
Semiconductor Devices and Sensor Devices
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Takeshi Ohwaki,
Yasunori Taga |
Research
Report
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Direct
Observation of Adsorption Reactions of Ti on Si(001)-2×1
by Scanning Tunneling Microscopy
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Kengo Ishiyama,
Yasunori Taga,
Ayahiko Ichmiya*
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Masahiko Ishii,
Takeshi Ohwaki,
Yasunori Taga
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Hisayoshi Fujikawa,
Takeshi Ohwaki,
Yasunori Taga
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Motofumi Suzuki,
Takeshi Ohwaki,
Yasunori Taga
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Ryouji Asahi,
Yasunori Taga
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Shizuo Tokito,
Jiro Sakata,
Yasunori Taga
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Topics
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Functional Test System for Automotive
Computers
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Noriyoshi Sano
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High Efficiency Linear Amplifier by Controlling Gate
Width of MESFET
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Takatoshi Kato
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GaAs MMIC for Low-noise Amplification
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Yuichi Tanaka
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GaAs Hall IC for High Temperature Operation
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Kenji Itoh
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Light Emission Analysis of Silicon Devices
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Takahide Sugiyama
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Prediction for Avalanche Induced Failure of Power
MOSFET
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Tsutomu Uesugi
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