The molecular orientation in copper phthalocyanine(CuPc) films deposited on metal films of Au, Ag, Cu and Cr has been studied by reflection-absorption infrared spectroscopy and X-ray diffraction. The molecular planes of the CuPc in the ultra-thin films (corresponding to several tens of monolayers) deposited on Au, Ag and Cu films were found to be nearly parallel to the metal film surfaces. The films further deposited (up to 1000Å thick ) on such ultra-thin films have a molecular orientation with the molecular planes inclined away from the metal film surfaces. This orientation corresponds to a crystal of the α-phase with a standing b axis configuration. However, the molecular planes of the CuPc deposited on Cr films are rather perpendicular to the Cr film surface. This CuPc film is in the α-phase with a parallel b axis configuration. The exposure of the Au and Cu films to air influences the molecular orientation of the CuPc deposited on the metal films. Considering the contamination of the metal film surfaces and the interaction between the surfaces and the CuPc molecules, the molecular orientation is discussed.
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