Published in Applied Surface Science

The study on “X-Ray Absorption Spectroscopy Unaffected by Self-Absorption” by Noritake Isomura et al. was published in Applied Surface Science.

X-ray absorption spectroscopy provides detailed information on the chemical state and atomic structure of materials; therefore, it is used as a powerful analytical tool in academia and industry. However, when detecting fluorescent X-rays for surface analysis, the self-absorption effect distorts the spectra, making identification of chemical states difficult. In this study, the self-absorption effect could be avoided in K-edge absorption measurement by detecting fluorescent X-rays with energy lower than usual. This was achieved using a detector that allows high-energy resolution and low-energy X-ray measurement at SUNBEAM in SPring-8, a large synchrotron radiation facility. This method replaces the L-edge absorption measurement with the same depth of analysis, allowing analysis of atomic structures, which has previously been difficult for some elements. Furthermore, this method can be applied to samples and powders with uneven surfaces; therefore, it is expected to contribute to the analysis and development of various actual parts and carbon-neutral catalysts.

Title: X-ray Absorption Spectroscopy without the Self-absorption Effect by Detecting L-line Fluorescence at the K-edge
Authors: Isomura, N., Kosaka, S., Takahashi, N.
Journal Name: Applied Surface Science
Published: October 5, 2022
https://doi.org/10.1016/j.apsusc.2022.155198